Webb• Used time-of-flight secondary ion mass spectrometry (TOF-SIMS) for surface characterization of materials for new product development as well as root cause analysis. WebbThe only scanning Auger nanoprobe in the world that guarantees a field emission electron source whose spatial resolution is 8 nm or less. Learn More Time-of-Flight SIMS / TOF …
Time-of-Flight SIMS - eTesters.com
WebbThe authors have developed a parallel imaging MS/MS capability for the PHI nanoTOF II time-of-flight secondary ion mass spectrometry (TOF-SIMS) instrument. The unique design allows a 1 Da wide precursor mass window to be extracted from a stream of mass separated secondary ions while all other secondary ions are detected in the normal … Webb27 okt. 2024 · The time-of-flight secondary ion mass spectrometry (ToF-SIMS) characterization was tested 10 1 − R T by PHI nanoTOF II Time-of-Flight SIMS equipped with GCIB Gun to sputter. The Fourier... gps wilhelmshaven personalabteilung
Company Profile and Milestone l ULVAC-PHI, Inc.
WebbPHI nanoTOF II TOF-SIMS Analysis with <70 nm spatial resolution Surface sensitive molecular imaging and trace analysis Multiple ion beams available for optimized depth profiling of organics, inorganics and mixed … WebbTime-of-Flight SIMS PHI nanoTOF II - Physical Electronics PHI’s patented TRIFT mass spectrometer with Parallel Imaging MS/MS provides superior sensitivity, low spectral … WebbTOF-SIMS allows monitoring of all species of interest simultaneously, and with high mass resolution. Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is an analytical … gps wilhelmshaven